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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/CheemaL92>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Manjit_S._Cheema>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Parag_K._Lala>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1992.232741>
foaf:homepage <https://doi.org/10.1109/VTEST.1992.232741>
dc:identifier DBLP conf/vts/CheemaL92 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1992.232741 (xsd:string)
dcterms:issued 1992 (xsd:gYear)
rdfs:label A new technique for totally self-checking CMOS circuit design for stuck-on and stuck-off faults. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Manjit_S._Cheema>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Parag_K._Lala>
swrc:pages 155-159 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1992>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/CheemaL92/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/CheemaL92>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1992.html#CheemaL92>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1992.232741>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title A new technique for totally self-checking CMOS circuit design for stuck-on and stuck-off faults. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document