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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/ChengTW01>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kuo-Liang_Cheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ming-Fu_Tsai>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS.2001.923443>
foaf:homepage <https://doi.org/10.1109/VTS.2001.923443>
dc:identifier DBLP conf/vts/ChengTW01 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS.2001.923443 (xsd:string)
dcterms:issued 2001 (xsd:gYear)
rdfs:label Efficient Neighborhood Pattern-Sensitive Fault Test Algorithms for Semiconductor Memories. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kuo-Liang_Cheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ming-Fu_Tsai>
swrc:pages 225-230 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2001>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/ChengTW01/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/ChengTW01>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2001.html#ChengTW01>
rdfs:seeAlso <https://doi.org/10.1109/VTS.2001.923443>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title Efficient Neighborhood Pattern-Sensitive Fault Test Algorithms for Semiconductor Memories. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document