Cellular automata for deterministic sequential test pattern generation.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vts/ChiusanoCPR97
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1997
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Cellular automata for deterministic sequential test pattern generation.
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deterministic automata; deterministic sequential test pattern generation; cellular automata; cellular automaton identification; stuck-at faults; FSM; hardware structure; evolutionary algorithm; fault coverage; area occupation; BIST; ASIC testing
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Cellular automata for deterministic sequential test pattern generation.
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