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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/ChungG06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kun_Young_Chung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sandeep_K._Gupta_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS.2006.45>
foaf:homepage <https://doi.org/10.1109/VTS.2006.45>
dc:identifier DBLP conf/vts/ChungG06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS.2006.45 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Low-Cost Scan-Based Delay Testing of Latch-Based Circuits with Time Borrowing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kun_Young_Chung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sandeep_K._Gupta_0001>
swrc:pages 8-15 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/ChungG06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/ChungG06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2006.html#ChungG06>
rdfs:seeAlso <https://doi.org/10.1109/VTS.2006.45>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title Low-Cost Scan-Based Delay Testing of Latch-Based Circuits with Time Borrowing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document