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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/CooperB94>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Carolina_L._C._Cooper>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_L._Bushnell>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1994.292311>
foaf:homepage <https://doi.org/10.1109/VTEST.1994.292311>
dc:identifier DBLP conf/vts/CooperB94 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1994.292311 (xsd:string)
dcterms:issued 1994 (xsd:gYear)
rdfs:label Neural models for transistor and mixed-level test generation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Carolina_L._C._Cooper>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_L._Bushnell>
swrc:pages 208-213 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1994>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/CooperB94/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/CooperB94>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1994.html#CooperB94>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1994.292311>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title Neural models for transistor and mixed-level test generation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document