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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/CremouxFGLP96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_Landrault>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christophe_Fagot>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Cremoux>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Serge_Pravossoudovitch>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510871>
foaf:homepage <https://doi.org/10.1109/VTEST.1996.510871>
dc:identifier DBLP conf/vts/CremouxFGLP96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1996.510871 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label A new test pattern generation method for delay fault testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_Landrault>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christophe_Fagot>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Cremoux>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Serge_Pravossoudovitch>
swrc:pages 296-301 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/CremouxFGLP96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/CremouxFGLP96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1996.html#CremouxFGLP96>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1996.510871>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject VLSI; built-in self test; integrated circuit testing; delays; logic testing; learning (artificial intelligence); automatic testing; digital integrated circuits; test pattern generation method; delay fault testing; high speed circuits; directed random generation technique; random test vectors; learning tool; test sequence length; delay fault coverage; BIST (xsd:string)
dc:title A new test pattern generation method for delay fault testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document