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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/DalpassoFO95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marcello_Dalpasso>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michele_Favalli>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Piero_Olivo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1995.512653>
foaf:homepage <https://doi.org/10.1109/VTEST.1995.512653>
dc:identifier DBLP conf/vts/DalpassoFO95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1995.512653 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Test pattern generation for IDDQ: increasing test quality. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marcello_Dalpasso>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michele_Favalli>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Piero_Olivo>
swrc:pages 304-309 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/DalpassoFO95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/DalpassoFO95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1995.html#DalpassoFO95>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1995.512653>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject automatic testing; integrated circuit testing; logic testing; CMOS logic circuits; test pattern generation; I/sub DDQ/ testing; ATPG strategy; fault coverage; quiescent power supply current monitoring (xsd:string)
dc:title Test pattern generation for IDDQ: increasing test quality. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document