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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/DasBB96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bhargab_B._Bhattacharya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Debesh_K._Das>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Uttam_K._Bhattacharya>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510894>
foaf:homepage <https://doi.org/10.1109/VTEST.1996.510894>
dc:identifier DBLP conf/vts/DasBB96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1996.510894 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Isomorph-redundancy in sequential circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bhargab_B._Bhattacharya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Debesh_K._Das>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Uttam_K._Bhattacharya>
swrc:pages 463-469 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/DasBB96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/DasBB96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1996.html#DasBB96>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1996.510894>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject logic testing; sequential circuits; redundancy; integrated circuit testing; VLSI; design for testability; logic design; isomorph-redundancy; sequential circuits; state diagram; reduced sequential machine; infinite family; DFT (xsd:string)
dc:title Isomorph-redundancy in sequential circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document