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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/EdirisooriyaE95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Geetani_Edirisooriya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Samantha_Edirisooriya>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1995.512645>
foaf:homepage <https://doi.org/10.1109/VTEST.1995.512645>
dc:identifier DBLP conf/vts/EdirisooriyaE95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1995.512645 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Diagnosis of scan path failures. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Geetani_Edirisooriya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Samantha_Edirisooriya>
swrc:pages 250-255 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/EdirisooriyaE95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/EdirisooriyaE95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1995.html#EdirisooriyaE95>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1995.512645>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject fault diagnosis; logic testing; integrated circuit testing; integrated logic circuits; design for testability; combinational circuits; scan path failures; scan based diagnostic schemes; faulty circuits; logic circuitry; scan chain fault diagnosis (xsd:string)
dc:title Diagnosis of scan path failures. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document