Optimization of analog IC test structures. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/vts/FeltS96>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Alberto_L._Sangiovanni-Vincentelli>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Eric_Felt>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510834>
foaf:homepage	<https://doi.org/10.1109/VTEST.1996.510834>
dc:identifier	DBLP conf/vts/FeltS96 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FVTEST.1996.510834 (xsd:string)
dcterms:issued	1996 (xsd:gYear)
rdfs:label	Optimization of analog IC test structures. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Alberto_L._Sangiovanni-Vincentelli>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Eric_Felt>
swrc:pages	48-53 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/vts/FeltS96/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/vts/FeltS96>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/vts/vts1996.html#FeltS96>
rdfs:seeAlso	<https://doi.org/10.1109/VTEST.1996.510834>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject	analogue integrated circuits; integrated circuit testing; integrated circuit measurement; integrated circuit noise; network parameters; design of experiments; statistical analysis; circuit optimisation; analog IC test structures; circuit parameters; measurement noise; statistical techniques; design of experiments; accuracy (xsd:string)
dc:title	Optimization of analog IC test structures. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document