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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/FummiS97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Donatella_Sciuto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Franco_Fummi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1997.599441>
foaf:homepage <https://doi.org/10.1109/VTEST.1997.599441>
dc:identifier DBLP conf/vts/FummiS97 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1997.599441 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
rdfs:label Implicit test pattern generation constrained to cellular automata embedding. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Donatella_Sciuto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Franco_Fummi>
swrc:pages 54-59 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1997>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/FummiS97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/FummiS97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1997.html#FummiS97>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1997.599441>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject built-in self test; implicit test pattern generation; cellular automata embedding; test sequence identification; autonomous finite state machine; circuit under test; controller; off-line self-testable circuit; stuck-at faults; BIST strategy; deterministic test sequences; ASIC design; MCNC benchmarks (xsd:string)
dc:title Implicit test pattern generation constrained to cellular automata embedding. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document