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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/GattikerM96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anne_E._Gattiker>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wojciech_Maly>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510844>
foaf:homepage <https://doi.org/10.1109/VTEST.1996.510844>
dc:identifier DBLP conf/vts/GattikerM96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1996.510844 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Current signatures [VLSI circuit testing]. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anne_E._Gattiker>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wojciech_Maly>
swrc:pages 112-117 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/GattikerM96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/GattikerM96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1996.html#GattikerM96>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1996.510844>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject VLSI; integrated circuit testing; CMOS integrated circuits; VLSI circuit testing; I/sub DDQ/ testing; current signature; passive defects; active defects (xsd:string)
dc:title Current signatures [VLSI circuit testing]. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document