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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/Ghosh-DastidarT00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jayabrata_Ghosh-Dastidar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nur_A._Touba>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.2000.843830>
foaf:homepage <https://doi.org/10.1109/VTEST.2000.843830>
dc:identifier DBLP conf/vts/Ghosh-DastidarT00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.2000.843830 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label A Rapid and Scalable Diagnosis Scheme for BIST Environments with a Large Number of Scan Chains. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jayabrata_Ghosh-Dastidar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nur_A._Touba>
swrc:pages 79-88 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/Ghosh-DastidarT00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/Ghosh-DastidarT00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2000.html#Ghosh-DastidarT00>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.2000.843830>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject built-in self-test Scan Chains, Design-for-Testability, Design-for-Diagnosis, Design-for-Debug, Integrated Circuits, LFSR, Multi-Input Signature Register, Integrated Circuits, Digital Testing (xsd:string)
dc:title A Rapid and Scalable Diagnosis Scheme for BIST Environments with a Large Number of Scan Chains. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document