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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/GirardLPR95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/B._Rodriguez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_Landrault>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Serge_Pravossoudovitch>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1995.512664>
foaf:homepage <https://doi.org/10.1109/VTEST.1995.512664>
dc:identifier DBLP conf/vts/GirardLPR95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1995.512664 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Diagnostic of path and gate delay faults in non-scan sequential circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/B._Rodriguez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_Landrault>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Serge_Pravossoudovitch>
swrc:pages 380-386 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/GirardLPR95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/GirardLPR95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1995.html#GirardLPR95>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1995.512664>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject fault diagnosis; logic testing; sequential circuits; delays; integrated circuit testing; automatic testing; integrated logic circuits; path delay faults; gate delay faults; nonscan sequential circuits; fault diagnosis; synchronous sequential circuits; path tracing; self-masking identification (xsd:string)
dc:title Diagnostic of path and gate delay faults in non-scan sequential circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document