Diagnostic of path and gate delay faults in non-scan sequential circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vts/GirardLPR95
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1995
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Diagnostic of path and gate delay faults in non-scan sequential circuits.
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fault diagnosis; logic testing; sequential circuits; delays; integrated circuit testing; automatic testing; integrated logic circuits; path delay faults; gate delay faults; nonscan sequential circuits; fault diagnosis; synchronous sequential circuits; path tracing; self-masking identification
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Diagnostic of path and gate delay faults in non-scan sequential circuits.
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