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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/GomezXCVDG20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anthony_Coyette>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Georges_G._E._Gielen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jhon_Gomez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nektar_Xama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ronny_Vanhooren>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wim_Dobbelaere>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS48691.2020.9107625>
foaf:homepage <https://doi.org/10.1109/VTS48691.2020.9107625>
dc:identifier DBLP conf/vts/GomezXCVDG20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS48691.2020.9107625 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anthony_Coyette>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Georges_G._E._Gielen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jhon_Gomez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nektar_Xama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ronny_Vanhooren>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wim_Dobbelaere>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2020>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2020.html#GomezXCVDG20>
rdfs:seeAlso <https://doi.org/10.1109/VTS48691.2020.9107625>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document