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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/GoorGMY96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Georgi_Gaydadjiev>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/V._G._Mikitjuk>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vyacheslav_N._Yarmolik>
foaf:homepage <http://csdl.computer.org/comp/proceedings/vts/1996/7304/00/73040272abs.htm>
foaf:homepage <http://dx.doi.org/10.1109%2FVTEST.1996.510868>
dc:identifier DBLP conf/vts/GoorGMY96 (xsd:string)
dc:identifier DOI 10.1109%2FVTEST.1996.510868 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label March LR: a test for realistic linked faults. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Georgi_Gaydadjiev>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/V._G._Mikitjuk>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vyacheslav_N._Yarmolik>
swrc:pages 272-280 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/GoorGMY96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/GoorGMY96>
rdfs:seeAlso <http://csdl.computer.org/comp/proceedings/vts/1996/7304/00/73040272abs.htm>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1996.html#GoorGMY96>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject integrated circuit testing; fault diagnosis; integrated memory circuits; linked faults; march tests; fault models; disturb faults; fault coverage; March LR; March LRD; March LRDD; semiconductor memories (xsd:string)
dc:title March LR: a test for realistic linked faults. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document