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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/GotoNI97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Goto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazuhiko_Iwasaki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shigeo_Nakamura>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1997.599438>
foaf:homepage <https://doi.org/10.1109/VTEST.1997.599438>
dc:identifier DBLP conf/vts/GotoNI97 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1997.599438 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
rdfs:label Experimental fault analysis of 1 Mb SRAM chips. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Goto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazuhiko_Iwasaki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shigeo_Nakamura>
swrc:pages 31-36 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1997>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/GotoNI97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/GotoNI97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1997.html#GotoNI97>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1997.599438>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject SRAM chips; SRAM chips; fault analysis; stuck-at cell faults; stuck-at bit-line faults; stuck-at word-line fault; neighborhood-pattern-sensitive faults; load capacity; margin fault detection; memory testing; 1 Mbit; 70 C; 30 pF (xsd:string)
dc:title Experimental fault analysis of 1 Mb SRAM chips. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document