[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/HansenH95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/John_P._Hayes>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mark_C._Hansen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1995.512612>
foaf:homepage <https://doi.org/10.1109/VTEST.1995.512612>
dc:identifier DBLP conf/vts/HansenH95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1995.512612 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label High-level test generation using physically-induced faults. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/John_P._Hayes>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mark_C._Hansen>
swrc:pages 20-28 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/HansenH95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/HansenH95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1995.html#HansenH95>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1995.512612>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject fault diagnosis; logic testing; automatic testing; integrated circuit testing; failure analysis; design for testability; high-level test generation; physically-induced faults; industry-standard single stuck-line faults; independent functional faults; functional tests; circuit under test; benchmark circuits; near-minimal size (xsd:string)
dc:title High-level test generation using physically-induced faults. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document