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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/HeraguPA96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Keerthi_Heragu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510832>
foaf:homepage <https://doi.org/10.1109/VTEST.1996.510832>
dc:identifier DBLP conf/vts/HeraguPA96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1996.510832 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Segment delay faults: a new fault model. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Keerthi_Heragu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
swrc:pages 32-41 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/HeraguPA96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/HeraguPA96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1996.html#HeraguPA96>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1996.510832>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject fault diagnosis; logic testing; delays; integrated circuit modelling; VLSI; integrated circuit testing; production testing; circuit analysis computing; automatic testing; segment delay faults; fault model; delay defect; spot defect; distributed defect; manufacturing defects; rising transitions; falling transitions; robust tests; transition tests; nonrobust tests (xsd:string)
dc:title Segment delay faults: a new fault model. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document