BIST-Aided Scan Test - A New Method for Test Cost Reduction.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vts/HiraideBKIEYM03
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/vts/HiraideBKIEYM03
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hideaki_Konishi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hitoshi_Yamanaka
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Koichi_Itaya
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kwame_Osei_Boateng
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Michiaki_Emori
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Takahisa_Hiraide
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Takashi_Mochiyama
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FVTEST.2003.1197675
>
foaf:
homepage
<
https://doi.org/10.1109/VTEST.2003.1197675
>
dc:
identifier
DBLP conf/vts/HiraideBKIEYM03
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FVTEST.2003.1197675
(xsd:string)
dcterms:
issued
2003
(xsd:gYear)
rdfs:
label
BIST-Aided Scan Test - A New Method for Test Cost Reduction.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hideaki_Konishi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hitoshi_Yamanaka
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Koichi_Itaya
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kwame_Osei_Boateng
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Michiaki_Emori
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Takahisa_Hiraide
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Takashi_Mochiyama
>
swrc:
pages
359-364
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/vts/2003
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/vts/HiraideBKIEYM03/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/vts/HiraideBKIEYM03
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/vts/vts2003.html#HiraideBKIEYM03
>
rdfs:
seeAlso
<
https://doi.org/10.1109/VTEST.2003.1197675
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/vts
>
dc:
subject
ATPG, BIST, ATE, test cost reduction, fault coverage
(xsd:string)
dc:
title
BIST-Aided Scan Test - A New Method for Test Cost Reduction.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document