On the diagnosis of programmable interconnect systems: Theory and application.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vts/HuangCL96
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/vts/HuangCL96
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Fabrizio_Lombardi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Wei-Kang_Huang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Xiao-Tao_Chen
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510859
>
foaf:
homepage
<
https://doi.org/10.1109/VTEST.1996.510859
>
dc:
identifier
DBLP conf/vts/HuangCL96
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FVTEST.1996.510859
(xsd:string)
dcterms:
issued
1996
(xsd:gYear)
rdfs:
label
On the diagnosis of programmable interconnect systems: Theory and application.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Fabrizio_Lombardi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Wei-Kang_Huang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Xiao-Tao_Chen
>
swrc:
pages
204-211
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/vts/HuangCL96/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/vts/HuangCL96
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/vts/vts1996.html#HuangCL96
>
rdfs:
seeAlso
<
https://doi.org/10.1109/VTEST.1996.510859
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/vts
>
dc:
subject
field programmable gate arrays; integrated circuit interconnections; fault diagnosis; logic testing; diagnosis; field programmable interconnect system; switch grid; FPGA; FPIS; Xilinx 3000
(xsd:string)
dc:
title
On the diagnosis of programmable interconnect systems: Theory and application.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document