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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/JasPT00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Jas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bahram_Pouya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nur_A._Touba>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.2000.843829>
foaf:homepage <https://doi.org/10.1109/VTEST.2000.843829>
dc:identifier DBLP conf/vts/JasPT00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.2000.843829 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Virtual Scan Chains: A Means for Reducing Scan Length in Cores. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Jas>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bahram_Pouya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nur_A._Touba>
swrc:pages 73-78 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/JasPT00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/JasPT00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2000.html#JasPT00>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.2000.843829>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject Embedded Cores, Scan Chains, Design-for-Testability, Integrated Circuits, Compression/Decompression, LFSR, Built-In Self-Test, Integrated Circuits, Digital Testing, Mapping, Reseeding, Virtual Scan, System Integrator (xsd:string)
dc:title Virtual Scan Chains: A Means for Reducing Scan Length in Cores. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document