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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/JeeF97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alvin_Jee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/F._Joel_Ferguson>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1997.600313>
foaf:homepage <https://doi.org/10.1109/VTEST.1997.600313>
dc:identifier DBLP conf/vts/JeeF97 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1997.600313 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
rdfs:label A methodolgy for characterizing cell testability. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alvin_Jee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/F._Joel_Ferguson>
swrc:pages 384-390 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1997>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/JeeF97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/JeeF97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1997.html#JeeF97>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1997.600313>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject integrated circuit design; cell testability; integrated circuit design; stuck-at fault coverage; IC quality; DPM; manufacturing defects; metric; physical design for testability (xsd:string)
dc:title A methodolgy for characterizing cell testability. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document