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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/KeM95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Premachandran_R._Menon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wuudiann_Ke>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1995.512667>
foaf:homepage <https://doi.org/10.1109/VTEST.1995.512667>
dc:identifier DBLP conf/vts/KeM95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1995.512667 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Multifault testability of delay-testable circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Premachandran_R._Menon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wuudiann_Ke>
swrc:pages 400-409 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/KeM95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/KeM95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1995.html#KeM95>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1995.512667>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject combinational circuits; logic testing; delays; multivalued logic circuits; delay-testable circuits; multifault testability; path-delay-fault testability; multiple stuck-at-fault testability; multilevel combinational circuits; robust path-delay-fault test set (xsd:string)
dc:title Multifault testability of delay-testable circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document