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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/KhocheB97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ajay_Khoche>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erik_Brunvand>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1997.600270>
foaf:homepage <https://doi.org/10.1109/VTEST.1997.600270>
dc:identifier DBLP conf/vts/KhocheB97 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1997.600270 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
rdfs:label Critical hazard free test generation for asynchronous circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ajay_Khoche>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erik_Brunvand>
swrc:pages 203-209 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1997>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/KhocheB97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/KhocheB97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1997.html#KhocheB97>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1997.600270>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject asynchronous circuits; self-timed control circuits; asynchronous circuits; critical hazard-free tests; six-valued algebra; macro-module library; partial scan based DFT environment; unbounded delay model; D-algorithm (xsd:string)
dc:title Critical hazard free test generation for asynchronous circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document