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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/KimCS96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bruce_C._Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Madhavan_Swaminathan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510866>
foaf:homepage <https://doi.org/10.1109/VTEST.1996.510866>
dc:identifier DBLP conf/vts/KimCS96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1996.510866 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Low-cost diagnosis of defects in MCM substrate interconnections. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bruce_C._Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Madhavan_Swaminathan>
swrc:pages 260-265 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/KimCS96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/KimCS96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1996.html#KimCS96>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1996.510866>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject multichip modules; integrated circuit interconnections; integrated circuit testing; fault diagnosis; fault location; substrates; low-cost diagnosis; MCM substrate interconnections; substrate interconnect defects; fault-dictionary; defect location; defect size (xsd:string)
dc:title Low-cost diagnosis of defects in MCM substrate interconnections. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document