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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/KimKA08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Byoungho_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jacob_A._Abraham>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nash_Khouzam>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS.2008.52>
foaf:homepage <https://doi.org/10.1109/VTS.2008.52>
dc:identifier DBLP conf/vts/KimKA08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS.2008.52 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Byoungho_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jacob_A._Abraham>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nash_Khouzam>
swrc:pages 293-298 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/KimKA08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/KimKA08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2008.html#KimKA08>
rdfs:seeAlso <https://doi.org/10.1109/VTS.2008.52>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject Mixed-Signal Testing, Loopback Test, Aperture Jitter, Analog-to-Digital Converter, Digital-to-Analog Converter, ADC, DAC (xsd:string)
dc:title Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document