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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/KimSR00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dilip_Risbud>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mani_Soma>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seongwon_Kim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.2000.843850>
foaf:homepage <https://doi.org/10.1109/VTEST.2000.843850>
dc:identifier DBLP conf/vts/KimSR00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.2000.843850 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label An Effective Defect-Oriented BIST Architecture for High-Speed Phase-Locked Loops. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dilip_Risbud>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mani_Soma>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seongwon_Kim>
swrc:pages 231-236 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/KimSR00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/KimSR00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2000.html#KimSR00>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.2000.843850>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject Built-In Self-Test (BIST), Design for Testability, Self-Checking Circuits, Defect-oriented testing, PLL (xsd:string)
dc:title An Effective Defect-Oriented BIST Architecture for High-Speed Phase-Locked Loops. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document