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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/KonijnenburgLG95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._Th._van_der_Linden>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._H._Konijnenburg>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1995.512661>
foaf:homepage <https://doi.org/10.1109/VTEST.1995.512661>
dc:identifier DBLP conf/vts/KonijnenburgLG95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1995.512661 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Compact test sets for industrial circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._Th._van_der_Linden>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._H._Konijnenburg>
swrc:pages 358-366 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/KonijnenburgLG95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/KonijnenburgLG95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1995.html#KonijnenburgLG95>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1995.512661>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject combinational circuits; logic testing; multivalued logic circuits; integrated circuit testing; automatic testing; compact test sets; industrial circuits; binary logic elements; xor gates; or gates; three-state elements; bidirectionals; automatic test pattern generation; test patterns; heuristics; compaction oriented decision making; test set size (xsd:string)
dc:title Compact test sets for industrial circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document