Generation of high quality tests for functional sensitizable paths.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vts/KrsticC95
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1995
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Generation of high quality tests for functional sensitizable paths.
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combinational circuits; logic testing; delays; timing; automatic testing; integrated circuit testing; high quality tests; functional sensitizable paths; combinational circuits; long paths; untestable paths; delay testing; faulty conditions; timing information; test derivation; test vectors
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Generation of high quality tests for functional sensitizable paths.
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