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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/LeeHRP96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Elizabeth_M._Rudnick>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ibrahim_N._Hajj>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Terry_Lee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510893>
foaf:homepage <https://doi.org/10.1109/VTEST.1996.510893>
dc:identifier DBLP conf/vts/LeeHRP96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1996.510893 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Genetic-algorithm-based test generation for current testing of bridging faults in CMOS VLSI circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Elizabeth_M._Rudnick>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ibrahim_N._Hajj>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Terry_Lee>
swrc:pages 456-462 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/LeeHRP96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/LeeHRP96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1996.html#LeeHRP96>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1996.510893>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject CMOS digital integrated circuits; VLSI; automatic testing; genetic algorithms; integrated circuit testing; fault location; logic testing; GA-based test generators; ATPG; bridging faults; CMOS VLSI circuits; automatic test pattern generator; I/sub DDQ/ current testing; CMOS digital circuits; two-line bridging fault set; adaptive genetic algorithm; compact test set generation (xsd:string)
dc:title Genetic-algorithm-based test generation for current testing of bridging faults in CMOS VLSI circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document