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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/LiLG23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mingye_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sandeep_Gupta_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yunkun_Lin>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS56346.2023.10139966>
foaf:homepage <https://doi.org/10.1109/VTS56346.2023.10139966>
dc:identifier DBLP conf/vts/LiLG23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS56346.2023.10139966 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Design for testability (DFT) for RSFQ circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mingye_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sandeep_Gupta_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yunkun_Lin>
swrc:pages 1-7 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/LiLG23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/LiLG23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2023.html#LiLG23>
rdfs:seeAlso <https://doi.org/10.1109/VTS56346.2023.10139966>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title Design for testability (DFT) for RSFQ circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document