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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/LinCPR00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wu-Tung_Cheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xijiang_Lin>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.2000.843847>
foaf:homepage <https://doi.org/10.1109/VTEST.2000.843847>
dc:identifier DBLP conf/vts/LinCPR00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.2000.843847 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label SIFAR: Static Test Compaction for Synchronous Sequential Circuits Based on Single Fault Restoration. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wu-Tung_Cheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xijiang_Lin>
swrc:pages 205-212 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/LinCPR00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/LinCPR00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2000.html#LinCPR00>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.2000.843847>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject Synchronous Sequential Circuits; Static Test Compaction; Test Segment; Parallel Pattern Simulator; Vector Restoration; Single Fault Restoration; Test Length; Fault Coverage (xsd:string)
dc:title SIFAR: Static Test Compaction for Synchronous Sequential Circuits Based on Single Fault Restoration. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document