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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/MacDonaldT02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eric_W._MacDonald>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nur_A._Touba>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS.2002.1011106>
foaf:homepage <https://doi.org/10.1109/VTS.2002.1011106>
dc:identifier DBLP conf/vts/MacDonaldT02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS.2002.1011106 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label Very Low Voltage Testing of SOI Integrated Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eric_W._MacDonald>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nur_A._Touba>
swrc:pages 25-30 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/MacDonaldT02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/MacDonaldT02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2002.html#MacDonaldT02>
rdfs:seeAlso <https://doi.org/10.1109/VTS.2002.1011106>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title Very Low Voltage Testing of SOI Integrated Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document