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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/MakarM95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Samy_Makar>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1995.512637>
foaf:homepage <https://doi.org/10.1109/VTEST.1995.512637>
dc:identifier DBLP conf/vts/MakarM95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1995.512637 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Checking experiments to test latches. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Samy_Makar>
swrc:pages 196-201 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/MakarM95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/MakarM95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1995.html#MakarM95>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1995.512637>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject CMOS logic circuits; logic testing; sequential circuits; fault diagnosis; circuit analysis computing; SPICE; finite state machines; integrated circuit testing; exhaustive functional tests; checking experiments; 2-state latches; minimum-length checking; D-latch; simulation; HSpice implementation; transmission gate latch; detectable shorted interconnects; open interconnects; short-to-power faults; short-to-ground faults; stuck open faults; stuck-on faults; pin fault test set; multiplexer-based test set; sequential elements; 2-state state machines; CMOS (xsd:string)
dc:title Checking experiments to test latches. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document