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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/MetraFR96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bruno_Ricc%E2%88%9A%E2%89%A4>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cecilia_Metra>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michele_Favalli>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510849>
foaf:homepage <https://doi.org/10.1109/VTEST.1996.510849>
dc:identifier DBLP conf/vts/MetraFR96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1996.510849 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Embedded two-rail checkers with on-line testing ability. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bruno_Ricc%E2%88%9A%E2%89%A4>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cecilia_Metra>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michele_Favalli>
swrc:pages 145-150 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/MetraFR96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/MetraFR96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1996.html#MetraFR96>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1996.510849>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject automatic testing; integrated circuit testing; logic testing; integrated logic circuits; VLSI; error detection; design for testability; embedded two-rail checkers; online testing ability; two-rail code; self-testing ability; compact structure (xsd:string)
dc:title Embedded two-rail checkers with on-line testing ability. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document