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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/MozaffariBSSFVM22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bonita_Bhaskaran>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kuo_Lin_Fu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mahmut_Yilmaz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nithin_Valentine>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/P._Manikandan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seyed_Nima_Mozaffari>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shantanu_Sarangi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Suhas_M._Satheesh>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS52500.2021.9794251>
foaf:homepage <https://doi.org/10.1109/VTS52500.2021.9794251>
dc:identifier DBLP conf/vts/MozaffariBSSFVM22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS52500.2021.9794251 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST). (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bonita_Bhaskaran>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kuo_Lin_Fu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mahmut_Yilmaz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nithin_Valentine>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/P._Manikandan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seyed_Nima_Mozaffari>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shantanu_Sarangi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Suhas_M._Satheesh>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/MozaffariBSSFVM22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/MozaffariBSSFVM22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts20222.html#MozaffariBSSFVM22>
rdfs:seeAlso <https://doi.org/10.1109/VTS52500.2021.9794251>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST). (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document