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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/MukherjeeKRT95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/H._Kassab>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janusz_Rajski>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jerzy_Tyszer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nilanjan_Mukherjee_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1995.512628>
foaf:homepage <https://doi.org/10.1109/VTEST.1995.512628>
dc:identifier DBLP conf/vts/MukherjeeKRT95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1995.512628 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Arithmetic built-in self test for high-level synthesis. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._Kassab>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janusz_Rajski>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jerzy_Tyszer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nilanjan_Mukherjee_0001>
swrc:pages 132-139 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/MukherjeeKRT95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/MukherjeeKRT95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1995.html#MukherjeeKRT95>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1995.512628>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject built-in self test; high level synthesis; logic CAD; logic testing; integrated circuit testing; arithmetic built-in self test; high-level synthesis; data path architectures; arithmetic blocks; test vectors; compact test responses; state coverage; testability; abstract level; testable circuit synthesis (xsd:string)
dc:title Arithmetic built-in self test for high-level synthesis. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document