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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/MukundMR95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shridhar_K._Mukund>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/T._R._N._Rao>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1995.512627>
foaf:homepage <https://doi.org/10.1109/VTEST.1995.512627>
dc:identifier DBLP conf/vts/MukundMR95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1995.512627 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label An apparatus for pseudo-deterministic testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shridhar_K._Mukund>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/T._R._N._Rao>
swrc:pages 125-131 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/MukundMR95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/MukundMR95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1995.html#MukundMR95>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1995.512627>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject logic testing; built-in self test; shift registers; integrated circuit testing; pseudo-deterministic testing; deterministic patterns; pseudo-random sequences; at-speed BIST; arbitrary length shift register; LFSR; care bits; test vector; tap configurations; test segments; don't care bits; random pattern resistant faults; interconnected logic blocks; computational efficiency (xsd:string)
dc:title An apparatus for pseudo-deterministic testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document