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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/Nicolaidis99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Nicolaidis>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1999.766651>
foaf:homepage <https://doi.org/10.1109/VTEST.1999.766651>
dc:identifier DBLP conf/vts/Nicolaidis99 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1999.766651 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
rdfs:label Time Redundancy Based Soft-Error Tolerance to Rescue Nanometer Technologies. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Nicolaidis>
swrc:pages 86-94 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1999>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/Nicolaidis99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/Nicolaidis99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1999.html#Nicolaidis99>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1999.766651>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject Very deep submicron, soft-errors, single event upsets, fault tolerant design. (xsd:string)
dc:title Time Redundancy Based Soft-Error Tolerance to Rescue Nanometer Technologies. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document