[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/Oakland91>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Steven_F._Oakland>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1991.208137>
foaf:homepage <https://doi.org/10.1109/VTEST.1991.208137>
dc:identifier DBLP conf/vts/Oakland91 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1991.208137 (xsd:string)
dcterms:issued 1991 (xsd:gYear)
rdfs:label Combining IEEE Standard 1149.1 with reduced-pin-count component test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Steven_F._Oakland>
swrc:pages 78-84 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1991>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/Oakland91/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/Oakland91>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1991.html#Oakland91>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1991.208137>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title Combining IEEE Standard 1149.1 with reduced-pin-count component test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document