[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/PanC96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chen-Yang_Pan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kwang-Ting_Cheng>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510898>
foaf:homepage <https://doi.org/10.1109/VTEST.1996.510898>
dc:identifier DBLP conf/vts/PanC96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1996.510898 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Implicit functional testing for analog circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chen-Yang_Pan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kwang-Ting_Cheng>
swrc:pages 489-494 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/PanC96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/PanC96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1996.html#PanC96>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1996.510898>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject analogue integrated circuits; mixed analogue-digital integrated circuits; integrated circuit testing; VLSI; transient response; implicit functional testing; analog circuits; linear time-invariant circuits; impulse response samples; pseudo-random technique; production testing time; fault coverage; yield coverages (xsd:string)
dc:title Implicit functional testing for analog circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document