Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vts/PolianKGERB05
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/vts/PolianKGERB05
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Bernd_Becker_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ilia_Polian
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jean-Marc_Galli%E2%88%9A%C2%AEre
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Michel_Renovell
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Piet_Engelke
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sandip_Kundu
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FVTS.2005.72
>
foaf:
homepage
<
https://doi.org/10.1109/VTS.2005.72
>
dc:
identifier
DBLP conf/vts/PolianKGERB05
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FVTS.2005.72
(xsd:string)
dcterms:
issued
2005
(xsd:gYear)
rdfs:
label
Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Bernd_Becker_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ilia_Polian
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jean-Marc_Galli%E2%88%9A%C2%AEre
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Michel_Renovell
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Piet_Engelke
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sandip_Kundu
>
swrc:
pages
343-348
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/vts/2005
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/vts/PolianKGERB05/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/vts/PolianKGERB05
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/vts/vts2005.html#PolianKGERB05
>
rdfs:
seeAlso
<
https://doi.org/10.1109/VTS.2005.72
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/vts
>
dc:
subject
Resistive bridging faults, Deep submicron technology modeling
(xsd:string)
dc:
title
Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document