Consistently dominant fault model for tristate buffer nets. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/vts/Powell96>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Theo_J._Powell>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510885>
foaf:homepage	<https://doi.org/10.1109/VTEST.1996.510885>
dc:identifier	DBLP conf/vts/Powell96 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FVTEST.1996.510885 (xsd:string)
dcterms:issued	1996 (xsd:gYear)
rdfs:label	Consistently dominant fault model for tristate buffer nets. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Theo_J._Powell>
swrc:pages	400-404 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/vts/Powell96/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/vts/Powell96>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/vts/vts1996.html#Powell96>
rdfs:seeAlso	<https://doi.org/10.1109/VTEST.1996.510885>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject	fault diagnosis; logic testing; integrated logic circuits; integrated circuit testing; VLSI; fault location; buffer circuits; ternary logic; multivalued logic circuits; consistently dominant fault model; tristate buffer nets; floating type faults; contention type faults; MISR signature loss; test pattern compression; fault detection; stuck faults (xsd:string)
dc:title	Consistently dominant fault model for tristate buffer nets. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document