On the effects of test compaction on defect coverage.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vts/ReddyPK96
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1996
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On the effects of test compaction on defect coverage.
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fault diagnosis; integrated circuit testing; test compaction; defect coverage; test sets; fault modeling; surrogate faults; test generation
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On the effects of test compaction on defect coverage.
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