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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/RenovellHB95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michel_Renovell>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/P._Huc>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yves_Bertrand>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1995.512635>
foaf:homepage <https://doi.org/10.1109/VTEST.1995.512635>
dc:identifier DBLP conf/vts/RenovellHB95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1995.512635 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label The concept of resistance interval: a new parametric model for realistic resistive bridging fault. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michel_Renovell>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/P._Huc>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yves_Bertrand>
swrc:pages 184-189 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/RenovellHB95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/RenovellHB95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1995.html#RenovellHB95>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1995.512635>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject VLSI; integrated circuit testing; fault diagnosis; logic testing; logic gates; automatic testing; electric resistance; resistance interval; parametric model; resistive bridging fault; intrinsic resistance; logic behavior; bridging faults; faulty behavior; fault detection; fault coverage; VLSI; logic gates; 0 to 500 ohm (xsd:string)
dc:title The concept of resistance interval: a new parametric model for realistic resistive bridging fault. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document