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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/RiedelR95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janusz_Rajski>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marc_D._Riedel>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1995.512642>
foaf:homepage <https://doi.org/10.1109/VTEST.1995.512642>
dc:identifier DBLP conf/vts/RiedelR95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1995.512642 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Fault coverage analysis of RAM test algorithms. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janusz_Rajski>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marc_D._Riedel>
swrc:pages 227-234 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/RiedelR95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/RiedelR95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1995.html#RiedelR95>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1995.512642>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject random-access storage; integrated circuit testing; integrated memory circuits; fault diagnosis; RAM test algorithms; fault coverage; flexible software analysis program; arbitrary test sequences; coverage statistics; functional cell-array faults; fault state transition conditions; representative fault classes; test algorithms; semiconductor memories (xsd:string)
dc:title Fault coverage analysis of RAM test algorithms. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document