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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/RoyMA21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Soham_Roy>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Spencer_K._Millican>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS50974.2021.9441051>
foaf:homepage <https://doi.org/10.1109/VTS50974.2021.9441051>
dc:identifier DBLP conf/vts/RoyMA21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS50974.2021.9441051 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Special Session - Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Soham_Roy>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Spencer_K._Millican>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
swrc:pages 1-14 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2021>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/RoyMA21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/RoyMA21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2021.html#RoyMA21>
rdfs:seeAlso <https://doi.org/10.1109/VTS50974.2021.9441051>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title Special Session - Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document