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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/SankaralingamOT00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nur_A._Touba>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rama_Rao_Oruganti>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ranganathan_Sankaralingam>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.2000.843824>
foaf:homepage <https://doi.org/10.1109/VTEST.2000.843824>
dc:identifier DBLP conf/vts/SankaralingamOT00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.2000.843824 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Static Compaction Techniques to Control Scan Vector Power Dissipation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nur_A._Touba>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rama_Rao_Oruganti>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ranganathan_Sankaralingam>
swrc:pages 35-42 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/SankaralingamOT00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/SankaralingamOT00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2000.html#SankaralingamOT00>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.2000.843824>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject Embedded Cores, Scan Chains, Design-for-Testability, Low Power, Static Compaction, Test Vector Compaction, Built-In Self-Test, Integrated Circuits, Digital Testing, Heat Minimization, Peak power, switching activity (xsd:string)
dc:title Static Compaction Techniques to Control Scan Vector Power Dissipation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document