Test preparation for high coverage of physical defects in CMOS digital ICs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vts/SantosSTT95
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/vts/SantosSTT95
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Isabel_C._Teixeira
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jo%E2%88%9A%C2%A3o_Paulo_Teixeira_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/M._Sim%E2%88%9A%C4%B6es
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Marcelino_B._Santos
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1995.512657
>
foaf:
homepage
<
https://doi.org/10.1109/VTEST.1995.512657
>
dc:
identifier
DBLP conf/vts/SantosSTT95
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FVTEST.1995.512657
(xsd:string)
dcterms:
issued
1995
(xsd:gYear)
rdfs:
label
Test preparation for high coverage of physical defects in CMOS digital ICs.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Isabel_C._Teixeira
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jo%E2%88%9A%C2%A3o_Paulo_Teixeira_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/M._Sim%E2%88%9A%C4%B6es
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Marcelino_B._Santos
>
swrc:
pages
330-337
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/vts/1995
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/vts/SantosSTT95/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/vts/SantosSTT95
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/vts/vts1995.html#SantosSTT95
>
rdfs:
seeAlso
<
https://doi.org/10.1109/VTEST.1995.512657
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/vts
>
dc:
subject
integrated circuit testing; automatic testing; logic testing; CMOS logic circuits; CMOS digital integrated circuits; high defect coverage; physical defects; CMOS digital ICs; pseudo realistic faults generation; test quality assessment; tabloid; iceTgen; I/sub DDQ/ test generation; test preparation
(xsd:string)
dc:
title
Test preparation for high coverage of physical defects in CMOS digital ICs.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document